The Methodology for Evaluating Half-value Layer and Its Influence on the Diagnostic Radiology*

OBJECTIVE: The critical analysis of the methodology for evaluating the x-ray beam half-value layer was based on technical standards for radiological protection and quality control in medical and dental diagnoses. MATERIALS AND METHODS: Exposure parameters, experimental set-up, scattering materials, instrumentation, size of radiation field and methodology of data analysis have been taken into consideration for measurements of half-value layer. RESULTS: The half-value layer, in good geometry, measured 2.44 ± 0.02 mmAl. A maximum deviation of 4.1% was found under other geometry conditions. A 98.8% deviation was observed with a different ionization chamber, and scattering material, and 29.5% with another type of detector. CONCLUSION: Results showed that no relevant variation is observed in the half-value layer for different radiation field sizes. On the other hand, the influence of the radiation scattering on the half-value layer overestimation was clearly observed, as well as the half-value layer reduction in the presence of lead used as scattering material. The practical methodology adopted for half-value layer evaluation has shown to be quite reliable, besides evidencing remarkable discrepancies resulting from the adoption of inappropriate methodologies, emphasizing the necessity of establishing a standard procedure for measuring the half-value layer.